Title: Research on advanced imaging strategies and automated manipulation methods for atomic force microscopy
Speaker: Pro. Fang Yongchun (Nankai University)
Time: December 17, 9:00-10:00
Online meeting venue: Tencent meeting (Room ID: 785 487 508)
With the rapid development of nano-science, an atomic force microscopy (AFM) has been playing an increasingly important role in many ﬁelds. An AFM has the ability to image and manipulate samples at micro-nano scale with the nano-level resolution, however, it still faces some drawbacks severely limiting its performance. Therefore, the speech presents the research on advanced imaging strategies and automated manipulation methods for the AFM. Specifically, focusing on the image distortion caused by hysteresis nonlinearity, thermal drift and vertical drift, advanced image distortion correction algorithms are first presented to improve the imaging quality of the AFM. Subsequently, aiming at the issue that the resonance frequency of the AFM scanner restricts the scanning speed, improved scanning strategies are proposed to achieve fast imaging of the AFM. Finally, some micro-nano manipulation methods including manipulation visualization, rapid elasticity measurement, automated micro-nano lettering and cell injection/grab are exhibited in the speech to highlight the practical application of the AFM.
Announced by the School of Mechanical and Automotive Engineering